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Morning track
Afternoon (Track A)
Afternoon (Track B)
Afternoon (Track C)
Afternoon (Track D)
9:00 AM - 9:30 AM | Registrations
9.30 AM - 9:45 AM | Welcome Address

Nasser Jariwala, Executive Director (Test & Measurement Division) - Rohde & Schwarz

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Nasser Jariwala
9:45 AM - 10:45 AM | Where Measurements Meet Innovation: Fueling the Next Era of Testing

Frank Oehler, Vice President (North Asia, Oceania, India, and ACIS) -  Rohde & Schwarz
Martin Bloss, Senior Director (Vector Transceiver, Non-Signalling, & Production Test) - Rohde & Schwarz

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Frank Oehler
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Martin Bloss
10:45 AM - 11:15 AM | AI-Native Telecom Networks: From 5G Evolution to 6G Intelligence

Sandeep Sharma, Head of emerging technologies-Network services - Tech Mahindra

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Sandeep Sharma

11.15 AM - 11.45 AM | Tea Break, Networking Session

11:45 AM - 12:15 AM | Safety-Critical EMC Challenges in Next-Generation Technologies

Ann Tat Kuah, Senior Director, (Solutions) - Rohde & Schwarz

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Ann Tat Kuah
12:15 PM - 1:00 PM | Panel Discussion: 6G for verticals – The value equation

Saubhagya Baliarsingh - Nokia                 Sandeep Sharma  - Tech Mahindra       Akshay Aggarwal - MediaTek
Reiner Stuhlfauth - Rohde &Schwarz       Vinay Prasad - Tejas Networks                  Mahesh Basavaraju - Rohde & Schwarz

Saubhagya Baliarsingh picture
Saubhagya Baliarsingh
Sandeep Sharma picture
Sandeep Sharma
Akshay Aggarwal picture
Akshay Aggarwal
Reiner Stuhlfauth picture
Reiner Stuhlfauth
Vinay Prasad picture
Vinay Prasad
Mahesh Kumar Basavaraju picture
Mahesh Kumar Basavaraju

1:00 PM - 2:15 PM | Lunch Break, & Networking Session

Next-Gen Wireless with AI and 6G

2:15 PM - 2:45 PM | The Evolution of AI-based Physical Layer Processing for 6G and Beyond

Bharath Shamasundar, Research Engineer - Nokia Bell Labs

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Bharath Shamasundar
2.45 PM - 3.10 PM | Ubiquitous AI - 6G Wireless and Intelligent Modems

Akshay Aggarwal, Senior Director of Engineering - MediaTek

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Akshay Aggarwal
3:10 PM - 3:35 PM | Seamless Connectivity - the new opportunities powered by NTN

Vinay Prasad, Associate Vice President (Satellite Communications) - Tejas Networks

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Vinay Prasad

3.35 PM - 4:00 PM | Tea Break, & Networking Session

4:00 PM - 4:30 PM | Test & Measurement perspective on 6G

Reiner Stuhlfauth, Technology Manager Wireless - Rohde & Schwarz

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Reiner Stuhlfauth

4:30 PM Onwards | Quiz/ Q&A/ Lucky draw

Pioneering Solutions for High-Speed Digital Test and Aerospace & Defence

2:15PM - 2:55 PM | Evolution of High-Speed Pipeline ADCs

Nithin Gopinath, Analog Applications and Validation Manager - Texas Instruments

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Nithin Gopinath
2:55 PM - 3:35 PM | AI at the edge - Creating an autonomous future

Preet Yadav,  Head India Innovation Ecosystem - NXP Semiconductors

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Preet Yadav

3.35 PM - 4:00 PM | Tea Break, & Networking Session

4:00 PM - 4:30 PM | Recent trends in EW and market needs

Pravin Mandrupkar, Vice President (R&D) - Astra Microwave Products

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Pravin Mandrupkar

4:30 PM Onwards | Quiz/ Q&A/ Lucky draw

Advanced EMC and Automotive Technologies

2:15 PM - 2:55 PM | Taming EMC Complexity with AI: A System Level Playbook for Electrified Powertrains—and Beyond

Lohith Kumar R, Technical Directors - Bosch Global Software Technologies

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Lohith Kumar
2:55 PM - 3:35 PM | The Satellite Radar Architecture

Aniruddha Shirahatti, Advanced Technical Manager - Aptiv

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Aniruddha Shirahatti

3.35 PM - 4:00 PM | Tea Break, & Networking Session

4:00 PM - 4:30 PM | Evolution from eCall to NG-eCall

Debasis Ratha, Principal Technical Trainer (Cellular), Rohde & Schwarz

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Debasis Ratha

4:30 PM Onwards | Quiz/ Q&A/ Lucky draw

Hands-on Sessions

Experience it live: Engage with experts and select your preferred sessions during registration.

Session slots will be allocated on a first-come, first-serve basis.

1.30 PM - 4.30 PM | GaN Device Characterization Test Bench

 Select your preferred time slot during registration

1.30 PM - 4.30 PM | Test & Measurement: AI Workplace

Select your preferred time slot during registration

1.30 PM - 4.30 PM | 10G Automotive Ethernet Testing Solutions

Select your preferred time slot during registration

1.30 PM - 4.30 PM | Conducted Emission Testing and Near-Field Investigation Methods

Select your preferred time slot during registration

4:30 PM Onwards | Quiz/ Q&A/ Lucky draw

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