From Concept to Circuit: Mastering Electronic Design & Testing, Tampere

Rohde & Schwarz and Würth Elektronik

With an increasing integration density the interaction between different building blocks of any electrical system becomes a more crucial task to be investigated. This presentation will give you an overview on how to select and verify appropriate filter components as well as how to efficiently hunt down root causes of intra- and inter-system EMC at your bench.

More and more applications become electrified and automated. Thus power consumption and efficiency become more important than in the past to reduce overall power consumption to a real minimum. This results in the need to efficient testing and adding counter measures like filters in the design. In this presentation we will give an overview what to keep in mind when designing your test bench and DUT especially for testing faster switching semiconductors made of SiC and GaN.

Highspeed interconnects play a more important role as the need for fast data exchange within a computing system, but also to peripherals is steadily increasing. At the same time cost per unit shall be decreased while still maintaining Signal and Power Integrity. In this webinar we will show you how a modern oscilloscope and the right probing solutions will support your debugging workflow as well as how to select and qualify the right filter elements like common mode chokes as well as how to find unbalances in the board design.

Smart devices are becoming more and more popular and so there is a higher need to integrate several communication interfaces and CPU’s or SoC’s that are capable of handling and processing the large amount of data generated. Thus filtering on interconnects like e.g. Ethernet and also Signal Integrity debugging on interfaces like PCIe, USB become more and more important. In this presentation an overview on the interaction of Power and Signal Integrity as well as the interaction of filtering on data lanes will be given.