SEMINARIO ON WAFER LOAD PULL MEASUREMENTS

Ponentes: R&S, Maury & MPI 

Ponente: Laura Gonzalo, R&S

Vector network analyzers are fundamental tools for semiconductor characterization. However, their use is often limited to S-parameter measurement. This presentation will demonstrate advanced measurement techniques utilizing Rohde & Schwarz vector network analyzers, enabling full exploitation of their capabilities – ranging from the characterization of device non-linearities to the amplifier’s noise figure. 

Ponente: Fabrizio Cagnin, MPI

Measuring the electrical characteristics of devices on the wafer is crucial during the development, validation and production of 5G, 6G and mmWave components. These measurements are essential for advancing technologies in telecommunications, defense and space applications. The precise characterization of amplifiers, mixers and lines is essential for the later integration into modules and products. In this presentation, MPI will outline its comprehensive range of solutions for wafer testing applications.
 

Ponente: Dirk Faber, Hitech 

Efficiency becomes more relevant today and tomorrow. Since amplifiers have a high contribution in power consumption a lot can be gained. Load pull measurements are more relevant than ever. During this presentation and demonstration, the audience will learn not only fundamentals but also advanced features like hybrid active and harmonic load pull. We will show a real setup and based on life measurements we show how these advanced configurations will contribute to improving the efficiency of modern amplifier technology.

Ponente: Dirk Faber, Hitech 

Ponentes: R&S, Maury & MPI