Course Description
Good measurements are essential for any test setup, whatever that scenario might be. Understanding basic requirements and terms are imperative to ensure the measurement accuracy and performance of a device under test. This full-day workshop will improve your understanding of basic test and measurement concepts, measurement techniques, and uses. We will also have a special presentation on Control Electronics for Quantum Computing, presented by Dr. Teakwan Yoon Application Scientist Quantum Technologies from Zurich Instruments. In addition, Rohde & Schwarz technical experts will discuss and demonstrate basic design engineering instruments, and techniques to solve design and measurement concerns for a broad range of applications.
What will you learn?
- Control Electronics for Quantum Computing
- Material Characterization: Dielectric & Impedance Spectroscopy
- Instrument Fundamentals
- Selecting the Right Instrument
- Practical Considerations
- Measurement Optimization
- Making Accurate Measurements
- And more…
Agenda
9:00 AM — 11:30 PM
► Topics of Discussion:
– Spectrum Analyzers
– Signal Generators
– Control Electronics for Quantum Computing - Presented by Dr. Taekwan Yoon, Application Scientist Quantum Technologies at Zurich Instruments. This presentation will discuss the basics of qubits and the role of control electronics for manipulation and measurement of qubits using Zurich instruments hardware solution and open-source software framework.
11:30 AM — 12:30 PM
► Lunch, Provided by Rohde & Schwarz
12:30 PM — 3:30 PM
► Topics of Discussion:
– Oscilloscopes & Power Supplies
– Vector Network Analyzers
– Material Characterization: Dielectric & Impedance Spectroscopy - Presented Eric Oseassen, Senior Staff Application Engineer at Rohde & Schwarz. This presentation will review the theoretical underpinnings of Dielectric Spectroscopy and will explore solutions to characterize a diversity of sample types, including liquids, powder (regolith), and sheet materials. We will also discuss classical impedance spectroscopy and explore some emerging materials characterization approaches.
Please arrive 30 minutes before the session to allow for registration & seating.
