High Speed Digital Cable Testing Seminar

Course Description

High-speed interconnect design and testing face increasing challenges as data rates rise and system densities grow, making signal integrity and accuracy critical. In this seminar, Rohde & Schwarz explores essential test methodologies for standards-compliant assemblies, accurate de-embedding techniques to isolate device-under-test performance, and test automation to streamline high-volume testing. Whether you're new to high-speed testing or looking to refine your approach, you'll leave with practical insights you can apply immediately.  Don't miss out on these important topics!

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What will you learn?

• Measuring digital signal channels using a vector network analyzer (VNA) 
• Characterizing channel insertion loss, return loss, and crosstalk parameters
• Performing time-domain reflectometry and eye diagram measurements
• Applying accurate de-embedding methods for test fixtures
• Testing cable compliance and optimizing performance
• And more…

Agenda

11:00 AM — 12:00 PM
► Signal integrity measurements using a vector network analyzer for 224/448G cables and PCIe interconnects
12:00 PM — 1:00 PM
► Lunch & Demonstrations, Provided by Rohde & Schwarz
1:00 PM — 3:00 PM
► Multi-port cable compliance testing for high-speed digital standards
► Networking

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Please arrive prior to the session to allow for registration & seating.