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Rohde & Schwarz, Maury and MPI are pleased to invite you to the first edition of the On Wafer Load Pull Measurements Seminar.


This event is designed to provide a comprehensive overview of advanced measurement techniques essential for modern semiconductor development. 

Join the experts from Rohde & Schwarz and our partners Maury and MPI and discover a demonstration of advanced on wafer load pull characterization of RF amplifiers, leveraging the precision of our R&S Vector Network Analyzer integrated with MPI’s probe station and Maury’s impedance tuners: a capability setting a new standard in semiconductor measurement.
 

Presentations will be delivered in English. 

Registration is essential as spaces are limited. Please register in advance to secure your attendance.

Details

October 16
10:00 AM - 4:30 PM
Rohde & Schwarz

TECMAIA Parque – Alfa++ Meeting Room

Rua Engenheiro Frederico Ulrich 2650
4470-605 Maia Porto
Portugal

Agenda

Agenda
October 16, 2025 at 10:00 AM — October 16, 2025 at 10:30 AM
Seminar Introduction

Speakers: R&S, Maury & MPI 

October 16, 2025 at 10:30 AM — October 16, 2025 at 11:15 AM
R&S Vector Network Analyzers - Introduction to advanced measurements

Speaker: Laura Gonzalo, R&S

Vector network analyzers are fundamental tools for semiconductor characterization. However, their use is often limited to S-parameter measurement. This presentation will demonstrate advanced measurement techniques utilizing Rohde & Schwarz vector network analyzers, enabling full exploitation of their capabilities – ranging from the characterization of device non-linearities to the amplifier’s noise figure. 

October 16, 2025 at 11:15 AM — October 16, 2025 at 12:00 PM
MPI Probe Station Introduction

Speaker: Fabrizio Cagnin, MPI

Measuring the electrical characteristics of devices on the wafer is crucial during the development, validation and production of 5G, 6G and mmWave components. These measurements are essential for advancing technologies in telecommunications, defense and space applications. The precise characterization of amplifiers, mixers and lines is essential for the later integration into modules and products. In this presentation, MPI will outline its comprehensive range of solutions for wafer testing applications.

October 16, 2025 at 12:00 PM — October 16, 2025 at 12:45 PM
Hybrid active (harmonic) Load pull for characterizing next generation Amplifiers

Speaker: Dirk Faber, Hitech 

Efficiency becomes more relevant today and tomorrow. Since amplifiers have a high contribution in power consumption a lot can be gained. Load pull measurements are more relevant than ever. During this presentation and demonstration, the audience will learn not only fundamentals but also advanced features like hybrid active and harmonic load pull. We will show a real setup and based on life measurements we show how these advanced configurations will contribute to improving the efficiency of modern amplifier technology.

October 16, 2025 at 12:45 PM — October 16, 2025 at 1:45 PM
Lunch
March 11, 2025 at 1:45 PM — October 16, 2025 at 4:15 PM
Load pull live demo

Speaker: Dirk Faber, Hitech 

October 16, 2025 at 4:15 PM — October 16, 2025 at 4:30 PM
Summary and Recap

Speakers: R&S, Maury & MPI

In collaboration with:

Rohde & Schwarz

Rohde & Schwarz

Maury Microwave

Maury Microwave

MPI Tech

MPI Tech

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